CRN/UEN: 200701417G
Mr Sam Neo
Shimadzu X-ray & 3D CT Inspection Systems
- For BGA & Flip-chip analysis
- IC chips & connector analysis
- Industrial X-ray CT machine
- Printed Circuit Board & electronic components inspection
- Precision parts and aluminium casting inspection
- Precision CT measurement
- X-ray services
Insight K.K. Scanning Acoustic Microscopy
- Flip-Chip analysis
- Bonded Wafers
- Underfill for micro electronics
- Delamination inspection
- Solar Cell inspection
- Power electronics/Devices inspection
EDX/XRF for ROHS and plating thickness measurement
Motic Microscopes
- 3D Digital Microscope
- High Power Microscope
- Low Power Microscope
- Camera system for Microscope
I-Optik digital video & autofocus microscope
Volume Graphics 3D CT data rendering software
Electronic Balances
Alpha/Beta/Gamma/X-ray Survey Meter
Portable 3D Scanner
Alex Corporation Ultrasonic for Cleaning & Welding solutions
Cross Section Equipment/Consumables